MATSCI 243
Electronic Materials Characterization
This course provides a detailed overview of important characterization techniques used to study the electrical, optical, magnetic, and piezoelectric properties of thin films, with an emphasis on semiconductors, for device applications. Key properties that can be extracted from each technique will be described and compared. Important models to extract key materials characteristics from raw data collected through ex situ and in situ techniques will also be introduced. This course emphasizes characterization techniques commonly available in modern laboratory settings and in industry.
Topics
- To familiarize students with some of the important methods of materials and device characterization useful in electronic, magnetic, optical and piezoelectric materials research. To help students acquire the knowledge and hone the thought processes necessary to choose and use materials characterization techniques wisely. To bring students to an appreciation of the power of combining characterization techniques. To help students to become aware of the development of new characterization technologies, how to find them, and how to judge them.
Official catalogue course objectives and student learning outcomes
Sources
- Course catalogue ↗2026-2027