Introduction to the SEM and Microprobe

3 credits · Graduate

This course will deal with scanning electron microscopy and with electron microprobe analysis. The electron optics of the scanning electron microscope and of the electron beam microprobe will be discussed. Electron/ specimen interactions will be studied including the excitation and absorption of X-rays. Correction techniques necessary for quantitative microanalysis and applications of the microprobe to the solution of materials problems will be discussed. Laboratory work will give students a working familiarity with the scanning electron microscope.A laboratory fee is applicable to this course.