(CHE 334) Electron Microscopy and Microanalysis 0,

4 Credits

Fundamentals and experimental methods in electron optical techniques including scanning electron microscopy (SEM), conventional transmission (TEM) and scanning transmission (STEM) electron microscopy. Specific topics covered will include electron optics, electron beam interactions with solids, electron diffraction and chemical microanalysis. Applications to the study of the structure of materials are given. Consent of department required.