Strategies for Nanocharacterization

3 Credits

Lectures describe various nanocharacterization techniques in terms of which technique is best for specific measurements on nanostructures less than 100 nm in extent. Special attention is paid to spatial resolution and detection limits for SEM, TEM, X-ray analysis, diffraction analysis, ion beam techniques, surface techniques, AFM and other SPMs, and light microscopies and spectroscopies.