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ENMA 683

Structural Determination Laboratory

1 Credit

The operation of an electron microscope is covered. TEM techniques that are used to characterize the structure, defects and composition of a sample are presented and used to study a variety of materials. These techniques are: electron diffraction patterns, bright/dark field imaging, high resolution lattic imaging and energy dispersive x-ray spectroscopy. Also covers different sample preparation techniques for TEM. The goal is that the students become independent users of the TEM.

Prerequisites & course information

Restriction: Permission of ENGR-Materials Science & Engineering department. Credit Only Granted for: ENMA698L or ENMA683 . Formerly: ENMA698L.

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