ENGPHYS 724
Materials Characterization by Electron/Ion Microscopy
Fall 2025 · Materials Characterization · C01
Readings
- Etext Scanning Electron Microscopy And X-Ray Microanalysis 6 Month AccessISBN 9781493966769; 9781493966745
Undated
Topics
- Introduction to the theory
- Physics and operating principles of Scanning electron microscopy (SEM
- Focused Ion Beam FIB microscopy
- Attendant diffraction
- Spectroscopy techniques
- Have laboratory component allowing
- Establish core competence