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EECS 579

Digital Systems Testing

4 credits · College of Engineering catalogue

Advisory Prerequisite: Graduate standing. Enforced Prerequisite: None. (4 credits) Overview of fault-tolerant computing. Fault sources and models. Testing process. Combinational circuit testing. D-Algorithm and PODEM. Sequential circuit testing. Checking experiments. RAM and microprocessor testing. Fault simulation. Design for testability. Testability measures. Self-testing circuits and systems.

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