EECS 579
Digital Systems Testing
Advisory Prerequisite: Graduate standing. Enforced Prerequisite: None. (4 credits) Overview of fault-tolerant computing. Fault sources and models. Testing process. Combinational circuit testing. D-Algorithm and PODEM. Sequential circuit testing. Checking experiments. RAM and microprocessor testing. Fault simulation. Design for testability. Testability measures. Self-testing circuits and systems.
Sources
- Course catalogue ↗2026-2027