3.040
Introduction to Materials Characterization
Introduction to the physical principles and common techniques of materials property measurement. Topics include metrology, optical microscopy, scanning electron microscopy, x-ray diffraction, atomic emission and infrared spectroscopy, mechanical testing, and thermal analysis. Laboratory-based assignments stress experimental technique, systematic troubleshooting, data collection and analysis, and reasoning about uncertainty. Limited to 10 due to lab space.
Prerequisites & course information
Prereq: ( 3.010 and 3.020 ) or permission of instructor U (Spring) 3-2-7 units
Sources
- Course catalogue ↗2026–2027