Ambient Methods for Surface Characterization

(3 Credit Hours) · Undergraduate

Ambient Methods for Surface Characterization. This course develops fundamental principles for characterizing surfaces and interfaces, particularly thin films, using infrared spectroscopy, ellipsometry, electrochemistry, and contact angle measurements. The material will cover reflection of light from surfaces, which is relevant to surface infrared spectroscopy, surface plasmon resonance and ellipsometry, surface energies, adsorption isotherms, and some fundamental aspects of electrical double layers, zeta potentials, and mass transport in electrochemistry.