Advanced Materials Characterization

4.0 credits

This course introduces the theory and application of characterization techniques for examining the atomic structure of materials. Student will learn about widely used materials in both academic and industrial research, including X-ray diffraction, electron microscopy, and spectroscopy. The fundamentals of these techniques will be demonstrated, along with their applications for analyzing nanostructures in a wide range of materials, such as catalysts, semiconductors, ceramics, and metals.