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OPT 442

Instrumental Optics

4.0 credits

This course provides an in-depth understanding of the principles and practices of optical instrumentation: Optical metrology, including wavefront and surface metrology, interferometric instruments and interferogram analysis, coherence and coherence-based instruments, phase measurement and phase-shifting interferometry; spectroscopic instrumentation, including the Fourier transfrom spectrometer, the Fabry-Perot interferometer, and the grating monochromator; image plane characterization (star test, Ronchi test, and modulation transfer function); the influence of illumination and partial coherence on image forming systems, including microscopes, systems for projection lithography, and displays.

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