EEC 286
— Introduction to Digital System Testing
Review of several current techniques used to detect physical faults in both combinational and sequential circuits. Topics include fault modeling, fault simulation, test generation, compression techniques, and testing architectures.
Topics
- fault modeling
- fault simulation
- test generation
- compression techniques
- and testing architectures
Topics explicitly listed in official catalogue description
Prerequisites & course information
Course Description: Review of several current techniques used to detect physical faults in both combinational and sequential circuits. Topics include fault modeling, fault simulation, test generation, compression techniques, and testing architectures. Learning Activities: Lecture 3 hour(s), Project. Grade Mode: Letter. Learning Activities: Lecture 3 hour(s), Project. Grade Mode: Letter.
Sources
- Course catalogue ↗2026-2027