MSE 164
X-ray Diffraction, Electron Microscopy, and Microanalysis
Material characterization using X-ray diffraction and scanning electron microscopy (SEM). Topics include X-ray diffraction and analysis; SEM imaging and microanalysis.
Topics
- X-ray diffraction and analysis
- SEM imaging and microanalysis
Topics explicitly listed in official catalogue description
Prerequisites & course information
Material characterization using X-ray diffraction and scanning electron microscopy (SEM). Topics include X-ray diffraction and analysis; SEM imaging and microanalysis.
Sources
- Course catalogue ↗2026-2027