MSE 264
Scanning Electron Microscopy
The theory and operation of the scanning electron microscope (SEM) and X-ray microanalysis. Topics covered include the basic design and electron optics, electron beam - specimen interactions, image formation and interpretation, X-ray spectrometry, and other related topics and techniques.
Topics
- the basic design and electron optics
- electron beam - specimen interactions
- image formation and interpretation
- X-ray spectrometry
- and other related topics and techniques
Topics explicitly listed in official catalogue description
Prerequisites & course information
The theory and operation of the scanning electron microscope (SEM) and X-ray microanalysis. Topics covered include the basic design and electron optics, electron beam - specimen interactions, image formation and interpretation, X-ray spectrometry, and other related topics and techniques.
Sources
- Course catalogue ↗2026-2027