Nanoscale Contact Mechanics credit:

4 Hours

Short- and long-range dipole and electronic interactions; particle- and surface-force interactions; contact mechanics of rigid and nonrigid media; continuum adhesion models; principles of Atomic Force Microscopy (AFM); artifacts and remedies in AFM imaging; force and scale calibration; dynamics of AC-AFM imaging; force spectroscopy; instrumented nanoindentation. Prerequisite: TAM 451 or TAM 551 .