Advanced Surface Characterization

3 ch (3C 1L*) (W) · Undergraduate

This course covers the basic principles and practical aspects of several advanced surface analysis techniques which include (i) X-ray photoelectron spectroscopy (XPS or ESCA), (ii) secondary ion mass spectrometry (SIMS), (iii) confocal laser scanning microscopy (CLSM), (iv) atomic force microscopy (AFM), and (v) scanning electron microscopy (SEM). Demonstrations will be given on most of these facilities. Students will propose a research method for tackling their interested problems by using one or two surface analysis techniques they have learned from this course.