Materials Characterization Techniques I

3 units

An introduction to the basic theory and instrumentation used in transmission electron, scanning electron, and optical microscopy. Practical laboratory experience in equipment operations, experimental procedures, and material characterization.Fundamentals, applications, and hands-on laboratory experience in transmission electron microscopy (TEM), scanning transmission electron microscopy (STEM), and scanning electron microscopy (SEM). Topics include wave optics of electrons, electron lenses and aberrations, electron-specimen interactions, electron diffraction theory, and quantitative elemental analysis using X-ray energy dispersive spectroscopy (XEDS) and electron energy loss spectroscopy (EELS).