NANO 601
Characterization of Nanomaterials
Spring 2026
Topics
- Optical, electron, scanning-probe and ion microscopy
- X-ray, electron and ion diffraction and scattering
- Thin-film technology
- Lithography
- Focused-ion-beam and stamp-based device fabrication
Readings
- Introduction to NanoscienceOptional/supplemental reading.
- Materials Characterization: Introduction to Microscopic and Spectroscopic MethodsOptional/supplemental reading.
Spring 2025
Topics
- Optical, electron, scanning-probe and ion microscopy
- X-ray, electron and ion scattering
- Thin-film technologies, lithography and focused-ion-beam processing
- Stamp-based fabrication and nanostructured materials
Readings
- Introduction to NanoscienceOxford, 2010; optional.
- Materials Characterization: Introduction to Microscopic and Spectroscopic MethodsWiley, 2008; optional.
Spring 2024
Topics
- Optical, electron, scanning-probe and ion microscopy
- X-ray, electron and ion scattering
- Thin-film technologies, lithography and focused-ion-beam processing
- Stamp-based fabrication and nanostructured materials
Readings
- Introduction to NanoscienceOxford, 2010; optional.
- Materials Characterization: Introduction to Microscopic and Spectroscopic MethodsWiley, 2008; optional.
Sources
- Course catalogue ↗2026–2027
- course_outline ↗Spring 2026
- course_outline ↗Spring 2025
- course_outline ↗Spring 2024
- Official public PDF outline or course description. Materials and topic extracts may be partial; consult the linked source for the full list.
- Official public PDF outline or course description. Materials and topic extracts may be partial; consult the linked source for the full list. Course title supplied from the current catalogue because the archival heading only gives the code.
- Official public PDF outline or course description. Materials and topic extracts may be partial; consult the linked source for the full list. Course title supplied from the current catalogue because the archival heading only gives the code.