CENG 6140
Surface and Thin Film Characterization
Fundamental and practical aspects of spectroscopy, diffraction, and microscopy related to the structural and chemical characterization of surfaces and thin films. Emphasis on identification of adsorbed species by vibrational spectroscopy, determination of the chemical state of the surface by photoelectron spectroscopy, quantitative methods in surface analysis, determination of surface structure by scanning probe microscopy techniques and diffraction methods, and recent advances in surface characterization. TTh 9am-10:15am
Sources
- Course catalogue โ2026โ2027